1 - S. A. Hoeing, Compressed Gas Magazine, August, 22, 1986. First paper on carbon dioxide snow cleaning, focus is on particle removal.
1 - W. Whitlock, in Proceedings of the 20th Annual Meeting of the Fine Particle Society, August, 1989. First paper using high velocity, double expansion nozzle. offered cleaning statistics and showed over 99.9% submicron particle removal.
1 - L. Layden and D. Wadlow, Journal of Vacuum Science and Technology, Vol. A8, pages 3881-3883, 1990. Demonstrated successful cleaning on a residual gas analyzer
2 - R. Sherman and W. Whitlock, Journal of Vacuum Science and Technology, Vol. B8, pages 563- 568, 1990. Paper discusses XPS data on cleaning contaminated Si wafers.
3 - R. Zito, “Cleaning large optics with CO2 snow”, Proc. SPIE 1236, Advanced Technology Optical Telescopes IV, 952 (1990); First paper on cleaning telescope mirrors.
1 - R. Sherman, J. Grob and W. Whitlock, Journal of Vacuum Science and Technology, Vol. B9, pages 1970-1977, 1991. Many examples on different materials.
1 - S. Hoenig and K. Kinkade, Inside ISHM, Jan/Feb., P. 13, 1993 - circuit boards
1 - E. Hill, Precision Cleaning Magazine, page 36, February, 1994. Paper on mechanisms and recontamination for the low velocity CO2 cleaning method.
2 - R. Sherman, D. Hirt, R. Vane, Journal of Vacuum Science and Technology, Vol. 12A, pages 1876-1881, 1994. Various applications, cleaning procedures and role of gas purity.
1 - R. Sherman and P. Adams, Proceedings - Precision Cleaning - 1995, p.271. Thirty pages, everything you wanted to know but was afraid to ask
2 - M. Hills, Journal of Vacuum Science and Technology, Vol. 13A, p. 30, 1995. Organic removal cleaning mechanisms and cleaning procedures.
3 - M. Hills, Journal of Vacuum Science and Technology, Vol. 13A, p.412, 1995. Static charge causes and mechanisms.
1 - S. Walheim, M. Boltau, J.Mlynek, G. Krausch, and U. Steiner, Structure Formation via Polymer Demixing in Spin-Cast Films Macromolecules 1997, 30, 4995-5003, the first of many papers on polymer adhesion and morphology on Si wafers.
S. H. Goss, L. Grazulis, D. H. Tomich, K. G. Eyink, S. D. Walck, T. W. Haas,
D. R. Thomas, and W. V. Lampert J. Vac. Sci. Technol. B 16, 1998 Mechanical lithography using a single point diamond machining
S. Walheim, R. Müller, M. Sprenger, E. Loser, J. Mlynek, and U. Steiner, Patterning Self-Assembled Monolayers on Oxide Surfaces Using a Lift-off Technique, Adv. Mater. 1999, 11, No. 17 page 1431 Cleaned substrates and the Self-Assembled monolayer layers. The self adsorbed monolayer reamined intact.
T. Pompe, VOLUME 89, NUMBER 7 PHYSICAL REVIEW LETTERS 12 AUGUST 2002 Line Tension Behavior of a First-Order Wetting System. Even CO2 cleaning gets mentioned in the premiere physics publication.
D. J. Miller, L. Sun,1 M. J. Walzak1 N. S. Mclntyre, D. Chvedov and A. Rosenfeld, Surf. Interface Anal. 2003; 35: 463–476 First published SIMS studies of carboxylic acids on gold and aluminium–magnesium alloy surfaces
I.C. Gebeshuber *, S. Cernusca, F. Aumayr, HP. Winter, AFM search for slow MCI-produced nanodefects on atomically clean monocrystalline insulator surfaces Nuclear Instruments and Methods in Physics Research B 205 (2003) 751–757. Cleaned AL2O3, SiO2 and LiF crystals with CO2. No reported damage on LiF, which is quite hard to clean. I wish they gave more details on cleaning as we have had damage to these materials.
E. S. Snow, J. P. Novak, P. M. Campbell, and D. Park, Applied Physics Letters VOL 82, NUMBER 13 31 2003 P.2145 How to clean a substrate with nanotubes and not remove the nanotubes.
M D Austin, W Zhang, H Ge, D Wasserman, S A Lyon and S Y Chou, Nanotechnology 16 (2005) 1058–1061 6 nm particle removal reported
B Y. Chow, D W. Mosley, and J M. Jacobson, “Perfecting Imperfect “Monolayers”: Removal of Siloxane Multilayers by CO2 Snow Treatment Langmuir 2005, 21, 4782-4785 Showed that CO2 snow cleaning assists in creating self assembled monolayers by removing overlayers and leaving just one monolayer.
Banerjee, S., Lin, C. C., Su, S., Bowers, C., Chung, H. F., Brandt, W., & Tang, K. "Characterization of photomask surface cleaning with cryogenic aerosol technique." Photomask Technology 2005. International Society for Optics and Photonics, 2005
J. C. J. van der Donck, R. Schmits, R. E. van Vliet and A. G. T. M. Bastein, “Removal of Sub-100 nm Particles from Structured Substrates with CO2 Snow”, in Proceedings MST Conference Particles on Surfaces 9: “Detection, Adhesion and Removal”. K. L. Mittal (Editor), 291, VSP Leiden and Boston (2006).
R. Sherman, Particulate Science and Technology Vol 25, p. 37-57, 2007. Carbon Dioxide Snow Cleaning. A more recent update and has more refernences.
L. H. (Hugh) Shockey Jr., Bringing out the “bling”: Decadence in glass, Objects Specialty Group Postprints, Volume Fifteen, 2008, pp. 1-12, American Institute for Conservation of Historic & Artistic Works, Glass
Dangwala, G Müller, D. Reschke, K Floettmann, and X Singer, “Effective removal of field-emitting sites from metallic surfaces by dry ice cleaning”, J. of Applied Physics 102, 044903 (2007). Cleaned RF resonating chambers.
Morris D.J., “Cleaning of diamond nanoindentation probes with oxygen plasma and carbon dioxide snow”, Review of Scientific Instruments 80, 126102 (2009).
L. H. Schockey, “Blow it off: Moving beyond compressed air with carbon dioxide snow”, in Objects Specialty Group Postprints, 16, American Institute for Conservation of Historic and Artistic Work, Washigton DC, 13-24 (2009).
D. A. Chernoff and R. Sherman, J. Vac. Sci. Technol. Vol B 28, p. 643 (2010) “Resurrecting dirty atomic force microscopy calibration standards” How to clean AFM samples, best shop note in JVST for 2010.
W S. Zimmt, N Odegaard, and D. R. Smith, “The Potential for Adapting Some Cleaning Methodologies to Pesticide Removal from Museum Objects” in Pesticide Mitigation in Museum Collections: Science in Conservation, edited by A. Elena Charola and Robert J. Koestler, Smithsonian Scholarly Press, Washington DC, (2010)
L. Zhu, P. Attard, and C. Neto, Reliable Measurements of Interfacial Slip by Colloid Probe Atomic Force Microscopy. II. Hydrodynamic Force Measurements, Langmuir 2011, 27, 6712–6719 To quote ”In the future, we suggest that the CO2 snow-jet cleaning procedure should be introduced in all force work. Therefore, particle contamination on the surface may explain the large slip lengths measured in some of our experiments”
J. T. Hugall, J. J. Baumberg, and S. Mahajan, “Disentangling the Peak and Background Signals in Surface-Enhanced Raman Scattering”, J. Phys. Chem. C, 116, 6184 (2012)
N Wang, J D. Zimmerman, X Tong, X Xiao, J Yu, and S R. Forrest , “Snow cleaning of substrates increases yield of large-area organic photovoltaics”, App. Phys. Letts, 101, 133901 (2012).
M. Schmeling, D.S. Burnett, J.H. Allton, M. Rodriguez, C.E. Tripa, and I.V. Veryovkin APpplication of CO2 Snow Jet Cleaning in conjunction with laboratory based Total Reflection X-Ray Fluorescense for Genesis Solar Wind, 44th Lunar and Planetary Science Conference (2013) Cleaned samples back from space
Taumer, R., Krome, T., Bowers, C., Varghese, I., Hopkins, T., White, R., Brunner, M. and Yi, D., 2014, October. Qualification of local advanced cryogenic cleaning technology for 14nm photomask fabrication. In Photomask Technology 2014 (Vol. 9235, p. 923525). Photomask cleaning and photomask repair.
M.Y. Kanga, HW Jeong, J Kim, J Lee, and J Jang, “Removal of biofilms using carbon dioxide aerosols”, 41 1044 (2010)
R. Singh, S Hong , and J Jang, “Mechanical desorption of immobilized proteins using carbon dioxide aerosols for reusable biosensors”, Analytica Chimica Acta 853 588 (2015)
R. Sherman, Carbon Dioxide Snow Cleaning Kohli, Rajiv, and Kashmiri L. Mittal, eds. Developments in Surface Contamination and Cleaning, Vol. 1: Fundamentals and Applied Aspects. William Andrew, 2015.
A. Vert, T. Orzali, T. Dyer, Ri. Hill, P.Satyavolu, E.Barth, R. Gaylord et al. "Backside and edge cleaning of III–V on Si wafers for contamination free manufacturing." In Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual SEMI, pp. 362-366. IEEE, 2015.
Feng, Xiaobing, Jonathan Pascal, and Simon Lawes “Development of CO2 snow cleaning for in-situ cleaning of mCMM stylus tips” Measurement Science and Technology 28, (2017) 015007
S. Jantzen, T. Decarreaux, M. Stein, K. Kniel, and A. Dietzel. "CO2 snow cleaning of miniaturized parts." Precision Engineering 52 (2018): 122-129
Hoffmann, W. Making Archaeology Cool with Dry Ice Cleaning, Physics Today, 71, p. 70 (2018) Dry ice pellets, not snow.
This bibliography on carbon dioxide snow cleaning has been complied to highlight important publications and are mostly peer reviewed papers. We have a bibliography over 22 pages and growing and we will gladly add your work to our list. Papers and reports from users can be included too. We want them!!! The list below excludes patents and oral presentations except in a few cases
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